Byte Paradigm Digital Pattern Generators
You are here:
The Debug Store >
Test Equipment >
Digital Pattern Generators >
Byte Paradigm Digital Pattern Generators Byte Paradigm Digital Pattern Generators have been designed to be part of the embedded design engineers standard toolkit. Digital signals up to 16 bits wide can be captured by each unit and stored. The captured data can then be replayed as test signals to the unit under test.
A C/C++ interface is provided do that the unit can be controlled externally by the Host PC as part of a test software suite. |
Click on Image for more details |
 Entry-level high-speed 16-bit digital pattern generator |  High-speed 16-bit digital pattern generator |